Core Grant Citation
This facility is funded by NCI # CA0166772. Publications should cite the Core grant in the acknowledgement section:
"Electron microscopy was performed by the CCSG-funded High Resolution Electron Microscopy Facility, NCI # CA0166772."
Rigor and Reproducibility
The SEM and TEM microscopes are calibrated several times each week with the aid of a magnification calibration diffraction grating replica. In addition, representatives from JEOL's technical service department conduct a rigorous twice-yearly performance evaluation/testing of the electron microscopes to ensure proper function. Preventative maintenance on the equipment is also scheduled during the performance evaluation period. Test samples submitted from investigators are always compared with control specimens.
Sample Preparation Protocols
A detailed set of protocols is provided to the investigator regarding the preparation of samples for SEM and TEM. In the majority of cases the investigator fixes the sample with fixative prepared by HREMF staff and HREMF staff performs subsequent processing. Screening of samples with the assistance of technical support is recommended at all times. Background references on the particular investigation are usually requested by HREMF to ensure that the correct fixatives and specific information regarding the specimen is known before the analysis.
Paper Submission Resources
To be included in the methods section of grant or manuscript submissions